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Kathleen G. Purdy
Kathleen G. Purdy
IBM
Electronic engineering
Wafer
Real-time computing
Burn-in
Stress testing
5
Papers
72
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Defect reduction through Lean methodology
2010
Kathleen G. Purdy
Louis Kindt
Jim Densmore
Craig Benson
Nancy Zhou
John M. Leonard
Cynthia Whiteside
Robert Nolan
David Shanks
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Combining negative binomial and Weibull distributions for yield and reliability prediction
2006
IEEE Design & Test of Computers
Thomas S. Barnett
Matt Grady
Kathleen G. Purdy
Adit D. Singh
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Citations (17)
Exploiting defect clustering for yield and reliability prediction
2005
Iet Computers and Digital Techniques
Thomas S. Barnett
Matt Grady
Kathleen G. Purdy
A.D. Singh
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Citations (14)
Yield-reliability modeling: experimental verification and application to burn-in reduction
2002
VTS | VLSI Test Symposium
Thomas S. Barnett
Adit D. Singh
Matt Grady
Kathleen G. Purdy
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Citations (25)
Redundancy implications for early-life reliability: experimental verification of an integrated yield-reliability model
2002
ITC | International Test Conference
Thomas S. Barnett
Matt Grady
Kathleen G. Purdy
Adit D. Singh
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Citations (16)
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