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Koichiro Mizukami
Koichiro Mizukami
Hitachi
Oxide
Scanning electron microscope
Dielectric
Alloy
Auger effect
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A new reliability problem associated with Ar ion sputter cleaning of interconnect vias
1989
IRPS | International Reliability Physics Symposium
Hideki Tomioka
Shinichi Tanabe
Koichiro Mizukami
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Citations (7)
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