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Koichi Kitahara

Shimane University

6

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18

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Crystal defects in epitaxial layer on nitrogen-doped Czochralski-grown silicon substrate (I): Investigation of the crystallographic structure

2004 Japanese Journal of Applied Physics
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Growth of SiC films using tetraethylsilane

2004 Materials Science Forum
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Defects in Polycrystalline Silicon Thin-Films Crystallized by Solid Phase and Excimer Laser Annealing

2003 Solid State Phenomena
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