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Thomas Barbieri
Thomas Barbieri
Research Triangle Park
Diode
Electronic engineering
Engineering physics
Materials science
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Surge current failure mechanisms in 4H-SiC JBS rectifiers
2018
ISPSD | International Symposium on Power Semiconductor Devices and IC's
Edward Van Brunt
Thomas Barbieri
Adam Barkley
Jim Solovey
J. Richmond
Brett Hull
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Reliability Testing of SiC JBS Diodes for Harsh Environment Operation
2018
Thomas Barbieri
Adam Barkley
Edgar Ayerbe
Zoltan Major
Matthias Tauer
Jonathan Young
Donald A. Gajewski
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Reliability of SiC Power Devices against Cosmic Ray Neutron Single-Event Burnout
2018
Materials Science Forum
Daniel J. Lichtenwalner
Akin Akturk
James M. McGarrity
Jim Richmond
Thomas Barbieri
Brett Hull
Dave Grider
Scott Allen
John W. Palmour
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Citations (18)
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