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Reliability of SiC Power Devices against Cosmic Ray Neutron Single-Event Burnout
Reliability of SiC Power Devices against Cosmic Ray Neutron Single-Event Burnout
2018
Daniel J. Lichtenwalner
Akin Akturk
James M. McGarrity
Jim Richmond
Thomas Barbieri
Brett Hull
Dave Grider
Scott Allen
John W. Palmour
Keywords:
Burnout
Power semiconductor device
Composite material
Neutron
MOSFET
Cosmic ray
Materials science
Electronic engineering
Diode
Engineering physics
single event burnout
Correction
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