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Wei-Ting Kary Chien

Semiconductor Manufacturing International Corporation

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An Extended Building-In Reliability Methodology on Evaluating SRAM Reliability by Wafer-Level Reliability Systems

2020 IEEE Transactions on Device and Materials Reliability
- Wei-Ting Kary Chien
- Feng Hao
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Statistical Process Control for Monitoring the Particles With Excess Zero Counts in Semiconductor Manufacturing

2019 IEEE Transactions on Semiconductor Manufacturing
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AdaBalGAN: An Improved Generative Adversarial Network With Imbalanced Learning for Wafer Defective Pattern Recognition

2019 IEEE Transactions on Semiconductor Manufacturing
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The Competing Aging Effects on SRAM Operating Life Tests

2019 IEEE Transactions on Device and Materials Reliability
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Highly effective low-k dielectric test structures and reliability assessment for 28NM technology node and beyond

2017 CSTIC | China Semiconductor Technology International Conference
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Advanced delayer methods for TEM sample preparations

2017 IPFA | International Symposium on the Physical and Failure Analysis of Integrated Circuits
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Exploration of baking temperature effects on 28 nm BEOL reliability

2017 Microelectronics Reliability
- XiangFu Zhao
- Wei-Ting Kary Chien
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Improvement on the stress migration in tungsten-plug via

2017 CSTIC | China Semiconductor Technology International Conference
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Reliability investigations on the programming currents of 28nm metal e-Fuse

2017 CSTIC | China Semiconductor Technology International Conference
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Investigations and detections on a new BEOL dielectric failure mechanism at advanced technologies

2017 Microelectronics Reliability
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