Old Web
English
Sign In
Acemap
>
authorDetail
>
O. Zimmerhackl
O. Zimmerhackl
GlobalFoundries
Electronic engineering
Silicon
Logic gate
Materials science
Communication channel
4
Papers
7
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (4)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Comparison of Analog and Noise Performance between Buried Channel versus Surface Devices in HKMG I/O Devices
2021
IRPS | International Reliability Physics Symposium
L. Pirro
A. Jayakumar
O. Zimmerhackl
D. Lipp
R. Illgen
A. Muehlhoff
R. Pfuetzner
Alban Zaka
Michael Otto
Jan Hoentschel
Y. Raffel
Konrad Seidel
Ricardo Olivo
Show All
Source
Cite
Save
Citations (0)
Area-Efficient and Bias-Flexible Inline Monitoring Structure for Fast Characterization of RTN and Transistor Local Mismatch in Advanced Technologies
2020
ICMTS | International Conference on Microelectronic Test Structures
A. Jayakumar
Nigel Chan
L. Pirro
O. Zimmerhackl
Michael Otto
T. Kleissner
Jan Hoentschel
Show All
Source
Cite
Save
Citations (1)
Low-Frequency Noise Reduction in 22FDX®: Impact of Device Geometry and Back Bias.
2019
IRPS | International Reliability Physics Symposium
Luca Pirro
Alban Zaka
O. Zimmerhackl
Tom Herrmann
Michael Otto
E. M. Bazizi
Jan Hoentschel
X. Li
R. Taylor
Show All
Source
Cite
Save
Citations (1)
RTN and LFN Noise Performance in Advanced FDSOI Technology
2018
ESSDERC | European Solid-State Device Research Conference
L. Pirro
O. Zimmerhackl
Alban Zaka
L. Miiller-Meskamp
R. Nelluri
T. Hermann
I. Cortes-Mayol
A. Huschka
M. Otto
Edward J. Nowak
A. Mittal
Jan Hoentschel
Show All
Source
Cite
Save
Citations (5)
1