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Arturo Plata G
Arturo Plata G
Grupo México
Coating
Evaporation
Conductive atomic force microscopy
Tin
Surface finish
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Characterization of the structure of the coating of multilayers using AFM and Interferometric Microscopy
2011
Martha I Jerez A
Laura Lara O
Luz D Morantes M
Arturo Plata G
Yezid Torres
Petr Tsygankov
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