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G. Tempel

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4

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58

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Deposition, annealing and characterisation of high-dielectric-constant metal oxide films

1995 Advanced Materials for Optics and Electronics
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Deposition, annealing and characterisation of high-dielectric-constant metal oxide films

1995 Advanced Materials for Optics and Electronics
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Channel-length-independent hot-carrier degradation in analog p-MOS operation

1992 IEEE Electron Device Letters
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