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Amel Akheyar
Amel Akheyar
IMEC
High-κ dielectric
Negative-bias temperature instability
Logic gate
Dielectric
Degradation (geology)
2
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14
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Positive and negative bias temperature instability on La2O3 and Al2O3 capped high-k MOSFETs
2009
Marc Aoulaiche
Ben Kaczer
Moonju Cho
Michel Houssa
Robin Degraeve
T. Kauerauf
Amel Akheyar
Tom Schram
Philippe Roussel
Herman Maes
Thomas Hoffmann
Serge Biesemans
G. Groeseneken
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Citations (4)
Positive and negative bias temperature instability in La 2 O 3 and Al 2 O 3 capped high-k MOSFETs
2009
IRPS | International Reliability Physics Symposium
Marc Aoulaiche
Ben Kaczer
Moonju Cho
Michel Houssa
Robin Degraeve
Thomas Kauerauf
Amel Akheyar
Tom Schram
Philippe Roussel
Herman Maes
Thomas Hoffmann
S. Biesemans
Guido Groeseneken
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Citations (10)
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