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Albena Paskaleva
Albena Paskaleva
Fraunhofer Society
Materials science
Dielectric
Metalorganic vapour phase epitaxy
Oxide
Leakage (electronics)
9
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115
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Effect of blocking and tunnel oxide layers on the charge trapping properties of MIS capacitors with ALD HfO2/Al2O3 nanolaminated films
2021
D. Spassov
Albena Paskaleva
E. Guziewicz
W Wozniak
T. Stanchev
Tz. E. Ivanov
J. Wojewoda-Budka
M Janusz-Skuza
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Dielectric properties of rf sputtered Ta2O5on rapid thermally nitrided Si
2005
Semiconductor Science and Technology
N. Novkovski
Albena Paskaleva
Elena Atanassova
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Conduction mechanisms and an evidence for phonon-assisted conduction process in thin high-k HfxTiySizO films
2005
Microelectronics Reliability
Albena Paskaleva
Anton J. Bauer
M. Lemberger
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Dielectric properties of rf sputtered Ta 2 O 5 on rapid thermally nitrided Si
2005
Semiconductor Science and Technology
N. Novkovski
Albena Paskaleva
Elena Atanassova
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Electrical properties of hafnium silicate films obtained from a single-source MOCVD precursor
2005
Microelectronics Reliability
M. Lemberger
Albena Paskaleva
Stefan Zürcher
Anton J. Bauer
L. Frey
H. Ryssel
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Citations (25)
1