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Toshi Nagatomo
Toshi Nagatomo
Thermography
Power semiconductor device
Electrical engineering
Thermal
Computer science
2
Papers
5
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Localization of electrical active defects on power devices using Lock-In Thermography and thermal trigger delay
2013
Christian Schmidt
Toshi Nagatomo
Koichi Endo
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Use of Lock-In Thermography for Non-Destructive 3D Defect Localization on System in Package and Stacked-Die Technology
2011
Rudolf Schlangen
Shinobu Motegi
Toshi Nagatomo
Christian Schmidt
Frank Altmann
Hiroaki Murakami
Stewart Hollingshead
John West
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Citations (5)
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