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B. Sallé
B. Sallé
CAMECA
Atom probe
Analytical chemistry
Materials science
Semiconductor
Metallurgy
2
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13
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Influence of multi-hit capability on quantitative measurement of NiPtSi thin film with laser-assisted atom probe tomography
2012
Applied Surface Science
T. Kinno
Haruko Akutsu
Mitsuhiro Tomita
Shigeru Kawanaka
Takeshi Sonehara
Akira Hokazono
L Renaud
I Martin
R Benbalagh
B. Sallé
Shiro Takeno
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Citations (13)
Review of Atom Probe Tomography Applications for Semiconductor materials
2009
Microscopy and Microanalysis
L Renaud
I Martin
B. Sallé
R Benbalagh
A Davis
M. Schuhmacher
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