Old Web
English
Sign In
Acemap
>
authorDetail
>
Yoshihiro Nagura
Yoshihiro Nagura
Mitsubishi
Computer science
Embedded system
Dram
Electronic engineering
Very-large-scale integration
5
Papers
25
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (5)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
プロセスモニタ回路を備えた半導体装置、その試験方法、並びにその製造方法
2002
Takanori Fujiwara
Yoshihiro Nagura
Mari Shibayama
yosihiro nagura
sinri sibayama
takanori fuziwara
Show All
Source
Cite
Save
Citations (0)
Accomplishment of At-Speed BISR for Embedded DRAMs(Special Issue on Test and Verification of VLSI)
2002
IEICE Transactions on Information and Systems
Yoshihiro Nagura
Yoshinori Fujiwara
Katsuya Furue
Ryuji Ohmitya
Tatsunori Komoike
Takenori Okitaka
Tetsushi Tanizaki
Katsumi Dosaka
Kazutami Arimoto
Yukiyoshi Koda
Tetsuo Tada
Show All
Source
Cite
Save
Citations (0)
Signal Management and Enhanced-on-Chip Tester
2001
Naoya Watanabe
Fukashi Morishita
Yasuhiko Taito
Akira Yamazaki
Katsumi Dosaka
Yoshikazu Morooka
Futoshi Igaue
Katsuya Furue
Yoshihiro Nagura
Tatsuya Komoike
Toshinori Morihara
Atsushi Hachisuka
Kazutami Arimoto
Hideyuki Ozaki
Show All
Source
Cite
Save
Citations (0)
An embedded DRAM hybrid macro with auto signal management and enhanced-on-chip tester
2001
ISSCC | International Solid-State Circuits Conference
Naoya Watanabe
Fukashi Morishita
Yasuhiko Taito
Akira Yamazaki
Tetsushi Tanizaki
Katsumi Dosaka
Yoshikazu Morooka
Futoshi Igaue
Katsuya Furue
Yoshihiro Nagura
Tatsunori Komoike
Toshinori Morihara
Atsushi Hachisuka
K. Arimoto
Hideyuki Ozaki
Show All
Source
Cite
Save
Citations (11)
Test cost reduction by at-speed BISR for embedded DRAMs
2001
ITC | International Test Conference
Yoshihiro Nagura
Michael A. Mullins
Anthony Sauvageau
Yoshinoro Fujiwara
Katsuya Furue
Ryuji Ohmura
Tatsunori Komoike
Takenori Okitaka
Tetsushi Tanizaki
Katsumi Dosaka
Kazutami Arimito
Yukiyoshi Koda
Tetsuo Tada
Show All
Source
Cite
Save
Citations (14)
1