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Mehmet S. Tamer

Netherlands Organisation for Applied Scientific Research

5

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22

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Real-Time Estimation of the Tip-Sample Interactions in Tapping Mode Atomic Force Microscopy with a Regularized Kalman Filter

2020 IEEE Transactions on Nanotechnology
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Improved sub-surface AFM using photothermal actuation (Conference Presentation)

2019
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Image-based overlay measurement using subsurface ultrasonic resonance force microscopy

2018
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Minimizing tip-sample forces and enhancing sensitivity in atomic force microscopy with dynamically compliant cantilevers

2017 Journal of Applied Physics
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Simultaneous AFM nano-patterning and imaging for photomask repair

2016 Proceedings of SPIE
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Citations (4)