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Sasan Keyvani
Sasan Keyvani
Atomic force microscopy
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Materials science
Dynamic range
Metrology
2
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2
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First results from the Large Dynamic Range Atomic Force Microscope for overlay metrology
2019
G Gert Witvoet
Joost Peters
Stefan Kuiper
Sasan Keyvani
Rob Willekers
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Improved sub-surface AFM using photothermal actuation (Conference Presentation)
2019
Maarten E. van Reijzen
Sasan Keyvani
Mehmet S. Tamer
Maarten H. van Es
Hamed Sadeghian
Marco van der Lans
Martijn M. C. J. M. van Riel
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