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Richard Poro
Richard Poro
IBM
Engineering
Electrical engineering
Electronic engineering
Extreme ultraviolet
Sheet resistance
2
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2
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0
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Exploring EUV mask backside defectivity and control methods
2015
Christina Turley
Jed H. Rankin
Louis Kindt
Mark Lawliss
Luke Bolton
Kevin W. Collins
Lin Cheong
Ravi Bonam
Richard Poro
Takeshi Isogawa
Eisuke Narita
Masayuki Kagawa
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Reflection control in VF-TLP systems
2014
EOS/ESD | Electrical Overstress/Electrostatic Discharge Symposium
Evan Grund
Thomas Young Chang
Robert J. Gauthier
Kyle Grund
Jorge Hernandez
Justin Katz
Richard Poro
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