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M. Schulz
M. Schulz
Ferdinand-Braun-Institut
Electronic engineering
Benchmarking
Epitaxy
Wafer
Engineering
3
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47
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Reliability issues of GaN based high voltage power devices
2011
Microelectronics Reliability
Joachim Wuerfl
Eldad Bahat-Treidel
Frank Brunner
E. Cho
Oliver Hilt
Ponky Ivo
A. Knauer
P. Kurpas
Richard Lossy
M. Schulz
S. Singwald
M. Weyers
Rimma Zhytnytska
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Citations (45)
Reliability Benchmarking of AlGaN/GaN-HFETs On Epitaxial Wafers From Different Vendors
2011
P. Kurpas
M. Schulz
I. Selvanathan
Richard Lossy
H. Sahin
J. Splettstoesser
Klaus Hirche
R. Jost
A. Barnes
Joachim Würfl
Günther Tränkle
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Stable and reproducible AlGaN/GaN-HFET processing highly tolerant for epitaxial quality variations
2010
P. Kurpas
I. Selvanathan
M. Schulz
H. Sahin
Ponky Ivo
M. Matalla
J. Splettstoesser
A. Barnes
Joachim Würfl
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Citations (2)
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