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Reliability Benchmarking of AlGaN/GaN-HFETs On Epitaxial Wafers From Different Vendors
Reliability Benchmarking of AlGaN/GaN-HFETs On Epitaxial Wafers From Different Vendors
2011
P. Kurpas
M. Schulz
I. Selvanathan
Richard Lossy
H. Sahin
J. Splettstoesser
Klaus Hirche
R. Jost
A. Barnes
Joachim Würfl
Günther Tränkle
Keywords:
Electronic engineering
Epitaxy
Wafer
Benchmarking
Materials science
algan gan
Engineering physics
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