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Eishi Ebe
Eishi Ebe
Hitachi
Engineering
Non-volatile memory
Electronic engineering
Miniaturization
Leakage (electronics)
1
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9
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Reliability issues of silicon LSIs facing 100-nm technology node
2002
Microelectronics Reliability
Eiji Takeda
Eiichi Murakami
K. Torii
Yutaka Okuyama
Eishi Ebe
Kenji Hinode
Shinichiro Kimura
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Citations (9)
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