author-photo

Mohamed Oulmane

Synopsys

6

Papers

33

Citations

Citation Trend

Filter By

Papers (5) Sort By

Journal Conference Others

Simulation of photoresist defect transfer through subsequent patterning processes

2020
Show All
- Source
- Cite
- Save
Citations (0)
Patterning process exploration of metal 1 layer in 7nm node with 3D patterning flow simulations

2015 Proceedings of SPIE
Show All
- Source
- Cite
- Save
Citations (3)
Symmetry reduction by surface scattering and mobility model for stressed 〈100〉/(001) MOSFETs

2010 SISPAD | International Conference on Simulation of Semiconductor Processes and Devices
Show All
- Source
- Cite
- Save
Citations (4)
Hole Mobility Model With Silicon Inversion Layer Symmetry and Stress-Dependent Piezoconductance Coefficients

2009 IEEE Electron Device Letters
Show All
- Source
- Cite
- Save
Citations (14)
Simulation of nMOSFETs with a Tensile Strained Cap Layer

2008
Show All
- Source
- Cite
- Save
Citations (9)