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T. Scheler
T. Scheler
European Synchrotron Radiation Facility
Lattice constant
Diffraction
Physics
X-ray crystallography
Nanostructure
2
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62
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In situ observation of the elastic deformation of a single epitaxial SiGe crystal by combining atomic force microscopy and micro x-ray diffraction
2009
Journal of Applied Physics
Mario S. Rodrigues
Thomas W. Cornelius
T. Scheler
C. Mocuta
A. Malachias
R. Magalhaes-Paniago
O. Dhez
F. Comin
T. H. Metzger
J. Chevrier
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Citations (22)
Probing the elastic properties of individual nanostructures by combining in situ atomic force microscopy and micro-x-ray diffraction
2009
Applied Physics Letters
T. Scheler
Mario S. Rodrigues
Thomas W. Cornelius
C. Mocuta
A. Malachias
R. Magalhaes-Paniago
F. Comin
J. Chevrier
T. H. Metzger
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Citations (40)
1