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J. Chevrier
J. Chevrier
European Synchrotron Radiation Facility
Optics
Diffraction
Physics
Non-contact atomic force microscopy
Electrostatic force microscope
5
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75
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From ensemble average to single (nano-) objects properties by X-ray microdiffraction: a short review on structure determination (local strain, composition, ...) and objects manipulation (AFM-coupled)
2010
Revue De Metallurgie-cahiers D Informations Techniques
C. Mocuta
K. Mundboth
J. Stangl
B. Krause
A. Malachias
Th. Scheller
Thomas W. Cornelius
R. Paniago
A. Diaz
Mario S. Rodrigues
J. Chevrier
O. Dhez
T. H. Metzger
G. Bauer
A. Barbier
A. V. Ramos
M.-J. Guittet
J.-B. Moussy
S. Stanescu
R. Mattana
C. Deranlot
F. Petroff
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In situ observation of the elastic deformation of a single epitaxial SiGe crystal by combining atomic force microscopy and micro x-ray diffraction
2009
Journal of Applied Physics
Mario S. Rodrigues
Thomas W. Cornelius
T. Scheler
C. Mocuta
A. Malachias
R. Magalhaes-Paniago
O. Dhez
F. Comin
T. H. Metzger
J. Chevrier
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Citations (22)
Probing the elastic properties of individual nanostructures by combining in situ atomic force microscopy and micro-x-ray diffraction
2009
Applied Physics Letters
T. Scheler
Mario S. Rodrigues
Thomas W. Cornelius
C. Mocuta
A. Malachias
R. Magalhaes-Paniago
F. Comin
J. Chevrier
T. H. Metzger
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Citations (40)
Signal amplitude and sensitivity of the Kelvin probe force microscopy
2006
Applied Physics Letters
T. Ouisse
Frederico Rodrigues Martins
M. Stark
S. Huant
J. Chevrier
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Citations (11)
Marking the Difference: Interferometric Detection vs Optical Beam Deflection in AFM
2003
Martin Stark
B. N. Bercu
Florence Marchi
J. Chevrier
S. Huant
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Citations (2)
1