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M. Kaufman
M. Kaufman
Texas Instruments
Chemistry
Optics
Offset (computer science)
Analytical chemistry
Transistor
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Comparison of convergent beam electron diffraction and geometric phase analysis for strain measurement in a strained silicon device
2011
Journal of Microscopy
D.R. Diercks
Guoda Lian
Jayhoon Chung
M. Kaufman
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Citations (17)
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