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D.R. Diercks
D.R. Diercks
University of North Texas
Optics
Strained silicon
Transistor
Chemistry
Diffraction
2
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20
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Comparison of convergent beam electron diffraction and geometric phase analysis for strain measurement in a strained silicon device
2011
Journal of Microscopy
D.R. Diercks
Guoda Lian
Jayhoon Chung
M. Kaufman
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Citations (17)
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