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D. Schepis
D. Schepis
Advanced Micro Devices
Electronic engineering
Electrical engineering
Silicon
Fabrication
Micrometre
2
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40
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Stress dependence and poly-pitch scaling characteristics of (110) PMOS drive current
2007
VLSIT | Symposium on VLSI Technology
B. Yang
K. Nummy
Andrew Waite
L. Black
H. Gossmann
H. Yin
Y. Liu
B. Kim
S. Narasimha
Philip A. Fisher
H.V. Meer
J. Johnson
D. Chidambarrao
S.D. Kim
C. Sheraw
D. Wehella-gamage
J. Holt
X. Chen
Dae-Gyu Park
C.Y. Sung
D. Schepis
M. Khare
Scott Luning
P. Agnello
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Citations (12)
Total-dose and SEU characterization of 0.25 micron CMOS/SOI integrated circuit memory technologies
1997
IEEE Transactions on Nuclear Science
R. Pugh
P. Duggan
J. Chavez
D. Schepis
D. Yee
S. Wu
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Citations (28)
1