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Kim M. Archuleta
Kim M. Archuleta
Sandia National Laboratories
Materials science
Ion beam
Polycrystalline silicon
Focused ion beam
Sputtering
2
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1
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Engineering the Microstructure and Morphology of Explosive Films via Control of Interfacial Energy.
2021
ACS Applied Materials & Interfaces
Eric C. Forrest
Robert Knepper
Michael T. Brumbach
Mark A. Rodriguez
Kim M. Archuleta
Michael P. Marquez
Alexander S. Tappan
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Residual Stress of Focused Ion Beam-Exposed Polycrystalline Silicon
2006
Kim M. Archuleta
David P. Adams
Michael J. Vasile
Julia E. Fulghum
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