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T. E. Kopley
T. E. Kopley
Fairchild Semiconductor International, Inc.
Dielectric strength
Electronic engineering
CMOS
Gate oxide
Time-dependent gate oxide breakdown
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Building-in reliability in BCD (Bipolar-CMOS-DMOS) technologies
2013
ASICON | International Conference on ASIC
Jifa Hao
T. E. Kopley
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