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Sanghyeon Jeon
Sanghyeon Jeon
Samsung
Electronic engineering
Logic gate
Effective method
Engineering
Transistor
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Investigation on the local variation in BCAT process for DRAM technology
2017
IRPS | International Reliability Physics Symposium
Sanghyeon Jeon
Jaehyun Choi
Hyuck-Chai Jung
Senyung Kim
Taewoo Lee
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