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Aniket Gupta

National Institute of Technology, Srinagar

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Soft Errors in Negative Capacitance FDSOI SRAMs

2021 EDTM | IEEE Electron Devices Technology and Manufacturing Conference
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Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET

2021 IRPS | International Reliability Physics Symposium
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On the Resiliency of NC-FinFET SRAMs against Variation: MFIS Structure

2021 SISPAD | International Conference on Simulation of Semiconductor Processes and Devices
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