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E. Augendre

IMEC

2

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48

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Impact of Stochastic Mismatch on Measured SRAM Performance of FinFETs with Resist/Spacer-Defined Fins: Role of Line-Edge-Roughness

2006 IEDM | International Electron Devices Meeting
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Demonstration of a New Approach Towards 0.25V Low-Vt CMOS Using Ni-Based FUSI

2006 VLSIT | Symposium on VLSI Technology
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Citations (7)