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Thomas Eickhoff
Thomas Eickhoff
Forschungszentrum Jülich
Materials science
Porous silicon
Analytical chemistry
Raman spectroscopy
Dielectric
3
Papers
29
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Color-Sensitive Si-Photodiode Using Porous Silicon Interference Filters
1997
Japanese Journal of Applied Physics
Michael Krüger
Michael Berger
Michel Marso
Winfried Reetz
Thomas Eickhoff
R. Loo
L. Vescan
M. Thönissen
H Lüth
Rüdiger Arens-Fischer
S. Hilbrich
Wolfgang Theiss
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Citations (15)
Quantum efficiency of a-Si:H p-i-n solar cells in the 250 to 375 K range-insights from defect pool modelling
1994
PEC | World Conference on Photovoltaic Energy Conversion
Thomas Eickhoff
Carsten Ulrichs
Helmut Stiebig
Werner Grunen
W. Reetz
H. Wagner
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Citations (2)
Optical characterization of porous silicon layers formed on heavily p-doped substrates
1992
Applied Surface Science
H. Münder
C Andrzejak
M.G. Berger
Thomas Eickhoff
H Lüth
Wolfgang Theiss
U. Rossow
W. Richter
R. Herino
M. Ligeon
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Citations (12)
1