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Schaekers Marc
Schaekers Marc
Physics
Electronic engineering
Engineering physics
Electrical engineering
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p‐SiGeへの2×10~ 9 Ωcm2接触抵抗率の周りの低温達成で形成されたTiSi(Ge)接触【Powered by NICT】
2017
IEEE Transactions on Electron Devices
Yu Hao
Schaekers Marc
Zhang Jian
Wang LinLin
Everaert Jean-Luc
Horiguchi Naoto
Jiang Yu-long
Mocuta Dan
Collaert Nadine
De Meyer Kristin
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MIS or MS? Source/drain contact scheme evaluation for 7nm Si CMOS technology and beyond
2016
International Workshop on Junction Technology
Yu Hao
Schaekers Marc
Demuynck Steven
Barla Kathy
Mocuta Anda
Horiguchi Naoto
Collaert Nadine
Thean Aaron Voon-Yew
De Meyer Kristin
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金属‐絶縁体‐半導体コンタクトの熱安定性関連:Ti/TiO2/n型Siコンタクトのケーススタディ
2016
IEEE Transactions on Electron Devices
Yu Hao
Schaekers Marc
Schram Tom
Demuynck Steven
Horiguchi Naoto
Barla Kathy
Collaert Nadine
Thean Aaron Voon-Yew
De Meyer Kristin
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7nm Si CMOS技術とそれ以降のためのMISまたはMSソース/ドレイン接触方式評価【Powered by NICT】
2016
Yu Hao
Schaekers Marc
Demuynck Steven
Barla Kathy
Mocuta Anda
Horiguchi Naoto
Collaert Nadine
Thean Aaron Voon-Yew
De Meyer Kristin
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プレコンタクト・アモルファス化注入処理によるSi:P上のケイ化チタン:1×10-9Ω・cm2に近付く接触抵抗
2016
IEEE Transactions on Electron Devices
Yu Hao
Schaekers Marc
Peter Anthony
Pourtois Geoffrey
Rosseel Erik
Lee Joon-Gon
Song Woo-Bin
Shin Keo Myoung
Everaert Jean-Luc
Chew Soon Aik
Demuynck Steven
Kim DaeYong
Barla Kathy
Mocuta Anda
Horiguchi Naoto
Thean Aaron Voon-Yew
Collaert Nadine
De Meyer Kristin
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