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D. Falguere
D. Falguere
Engineering
Upset
Physics
Proton
Electronic engineering
4
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43
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Preliminary Flight Data From the Materials Exposure and Degradation experiment (MEDET)
2009
Adrian Tighe
M. Van Eesbeek
Sophie Duzellier
Magdeleine Dinguirard
D. Falguere
C. Pons
Virginie Inguimbert
Ch. Durin
S.B. Gabriel
D. Goulty
G.T. Roberts
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Citations (5)
SEU induced by pions in memories from different generations
2001
IEEE Transactions on Nuclear Science
S. Duzellier
D. Falguere
M. G. Tverskoy
E.M. Ivanov
R. Dufayel
M.-C. Calvet
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Citations (12)
Low energy proton induced SEE in memories
1997
IEEE Transactions on Nuclear Science
S. Duzellier
Robert Ecoffet
D. Falguere
T. Nuns
L. Guibert
W. Hajdas
M.C. Calvert
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Citations (26)
SEETEST : A. SYSTEM DE DICAT ED TO THE CHA R ACTERIS ATION OF WORY SE;JVSITIVITY TO SF&
1992
D. Falguere
S. Duzellier
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