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T. Sekine

Kanazawa Institute of Technology

5

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37

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Atomic level analysis of electron emitter surfaces by the scanning atom probe

1999 IVESC | International Vacuum Electron Sources Conference
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Atom-by-atom analysis of microtip emitter surfaces by the scanning atom probe

1999 Journal of Vacuum Science & Technology B
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Atomic-by-atom analysis of micro tip emitter surfaces by the scanning atom probe

1998 IVMC | International Vacuum Microelectronics Conference
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Development of a scanning atom probe and atom-by-atom mass analysis of diamonds

1998 Applied Physics A
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Atomic Investigation of Individual Apexes of Diamond Emitters by a Scanning Atom Probe

1997 ICVM | International Conference on Vacuum Microelectronics
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