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K. Tanaka

Kanazawa Institute of Technology

6

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59

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Development of the Scanning Atom Probe and Atomic Level Analysis

2000 Materials Characterization
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Atom-by-atom analysis of diamond, graphite, and vitreous carbon by the scanning atom probe

2000 Journal of Vacuum Science & Technology B
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Atomic level analysis of silicon emitters utilizing the scanning atom probe

2000 Journal of Vacuum Science & Technology B
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Atomic level analysis of electron emitter surfaces by the scanning atom probe

1999 IVESC | International Vacuum Electron Sources Conference
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Atom-by-atom analysis of microtip emitter surfaces by the scanning atom probe

1999 Journal of Vacuum Science & Technology B
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Atomic-by-atom analysis of micro tip emitter surfaces by the scanning atom probe

1998 IVMC | International Vacuum Microelectronics Conference
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