Old Web
English
Sign In
Acemap
>
authorDetail
>
T. Larrabee
T. Larrabee
Physical design
Design for testing
Electronic circuit
Electronic engineering
Logic gate
1
Papers
1
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (1)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
A study on the utility of using expected quality level as a design for testability metric
1998
VTS | VLSI Test Symposium
D. Williams
F.J. Ferguson
T. Larrabee
Show All
Source
Cite
Save
Citations (1)
1