A study on the utility of using expected quality level as a design for testability metric
1998
This paper develops a Physical Design for Test (PDFT) metric that is directly related to the expected quality level (QL) contribution of a cell to a circuit, and it details experimental results showing the usefulness of this metric in predicting the quality level contribution of a cell to circuits that have yet to be designed. The PDFT metric shows what QL increase can be expected for the circuit by changing the physical design of a component of the circuit.
Keywords:
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
12
References
1
Citations
NaN
KQI