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Eunkyeong Choi
Eunkyeong Choi
Samsung
Electronic engineering
Engineering
Image sensor
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2
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Reliability characterization of advanced CMOS image sensor (CIS) with 3D stack and in-pixel DTI
2018
IRPS | International Reliability Physics Symposium
Younggeun Ji
Jeong-Hoon Kim
Jungin Kim
Miji Lee
Jae Heon Noh
Tae-Young Jeong
Juhyeon Shin
Junho Kim
Young Heo
Ung Cho
Hyunchul Sagong
Junekyun Park
Yeonsik Choo
Gilhwan Do
Hoyoung Kang
Eunkyeong Choi
Dongyoon Sun
Changki Kang
Sang-chul Shin
Sangwoo Pae
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Effects of front-end-of line process variations and defects on retention failure of flash memory: Charge loss/gain mechanism
2015
IRPS | International Reliability Physics Symposium
Jongwoo Park
Miji Lee
Hanbyul Kang
Wooram Ko
Eunkyeong Choi
Junsik Im
Minwoo Lee
Dohwan Chung
Jinchul Park
Sang-chul Shin
Sangwoo Pae
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