Old Web
English
Sign In
Acemap
>
authorDetail
>
Tuyoshi Fujiwara
Tuyoshi Fujiwara
Hitachi
Dielectric
Capacitor
Optoelectronics
Linearity
Electronic engineering
1
Papers
3
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (1)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
DC-stress-induced Degradation of Analog Characteristics in HfxAl(1-x)O MIM Capacitors
2006
IEDM | International Electron Devices Meeting
Kenichi Takeda
Renichi Yamada
Toshinori Imai
Tuyoshi Fujiwara
Takashi Hashimoto
Toshio Ando
Show All
Source
Cite
Save
Citations (3)
1