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H. Marchman
H. Marchman
Analytical chemistry
Chemistry
Optics
Experimental data
CMOS
2
Papers
22
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Conductance-atomic force microscope characterization of focused ion beam chip repair processes
2002
Journal of Vacuum Science & Technology B
H. Marchman
J. McMurray
H. Wildman
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Integration of unit processes in a shallow trench isolation module for a 0.25 μm complementary metal–oxide semiconductor technology
1997
Journal of Vacuum Science & Technology B
Amitava Chatterjee
Iqbal Ali
Keith A. Joyner
Doug Mercer
John Kuehne
Mark E. Mason
A.L. Esquivel
D. Rogers
S OBrien
P. Mei
Suhail Murtaza
S.P. Kwok
Kelly J. Taylor
Somnath S. Nag
Greg A. Hames
Maureen A. Hanratty
H. Marchman
S. Ashburn
Ih-Chin Chen
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Citations (22)
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