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Young Joon Cho
Young Joon Cho
Chungbuk National University
Analytical chemistry
Electron energy loss spectroscopy
Thin film
Band gap
X-ray photoelectron spectroscopy
4
Papers
64
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Damage profiles of Si (001) surface via Ar cluster beam sputtering
2013
Surface and Interface Analysis
Yong-Koo Kyoung
Hyung-Ik Lee
Jae Gwan Chung
Sung Heo
Jae Cheol Lee
Young Joon Cho
Hee Jae Kang
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Citations (7)
Electronic and optical properties of La-aluminate dielectric thin films on Si (100)
2010
Surface and Interface Analysis
Dahlang Tahir
Eun Hye Choi
Young Joon Cho
Suhk Kun Oh
Hee Jae Kang
Hua Jin
Sung Heo
Jae Gwan Chung
Jae Cheol Lee
S. Tougaard
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Citations (18)
Band gap engineering for La aluminate dielectrics on Si (100)
2008
Applied Physics Letters
Hua Jin
Young Joon Cho
Suhk Kun Oh
Hee Jae Kang
Ju-chul Park
Sung Heo
Jae Cheol Lee
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Citations (17)
Electronic properties of ultrathin (HfO2)x(SiO2)1−x dielectrics on Si (100)
2007
Journal of Applied Physics
Hua Jin
Suhk Kun Oh
Young Joon Cho
Hee Jae Kang
S. Tougaard
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Citations (22)
1