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Jae Gwan Chung

Samsung

34

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598

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Bevel Structure Based XPS Analysis as a Non‐Destructive Chemical Probe for Complex Interfacial Structures of Organic Semiconductors

2021
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Understanding on the effects of chemical reaction at cathode-electrolyte interface in sulfide based all-solid-state batteries

2019 Journal of Materials Chemistry
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Fabrication of Metal/Graphene Hybrid Interconnects by Direct Graphene Growth and Their Integration Properties

2018 Advanced electronic materials
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Understanding the structural, electrical, and optical properties of monolayer h-phase RuO2 nanosheets: A combined experimental and computational study

2018 Npg Asia Materials
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Degradation by water vapor of hydrogenated amorphous silicon oxynitride films grown at low temperature

2017 Scientific Reports
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Band alignment of atomic layer deposited (HfZrO{sub 4}){sub 1−x}(SiO{sub 2}){sub x} gate dielectrics on Si (100)

2015 Applied Physics Letters
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Effect of Chlorine Plasma Treatment on Electronic Properties of GIZO Thin Film Grown on SiO2/Si Substrate

2014 Journal of Mathematical and Fundamental Sciences
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Electrical, electronic and optical properties of amorphous indium zinc tin oxide thin films

2014 Applied Surface Science
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Anion control as a strategy to achieve high-mobility and high-stability oxide thin-film transistors

2013 Scientific Reports
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The Effect of the Oxygen Flow Rate on the Electronic Properties and the Local Structure of Amorphous Tantalum Oxide Thin Films

2013
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