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Congshu Zhou
Congshu Zhou
GlobalFoundries
Physical design
Design for manufacturability
Standard cell
Engineering drawing
Process control
5
Papers
4
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Machine learning versus Deep Learning in Low Yield Wafer Map Classification
2021
ASMC | Advanced Semiconductor Manufacturing Conference
Congshu Zhou
Hingpoh Kuan
Guozhong You
Douglas Chan
Jason Khaw
Summer Boo
Hein Mun Lam
Elton Ng
Juliana Puey
Saiking Chong
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AI Solution for Metrology Recipe Automation
2021
ASMC | Advanced Semiconductor Manufacturing Conference
Congshu Zhou
Zheng Zou
Fang Li
Seng Keat Lim
Jason Khaw
Summer Boo
Hein Mun Lam
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Imaging quality full chip verification for yield improvement
2013
Proceedings of SPIE
Qing Yang
Congshu Zhou
ShyueFong Quek
Mark Lu
YeeMei Foong
Jianhong Qiu
Taksh Pandey
Russell Dover
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Design for manufacturing layout analyses correlate layout to physico-chemical yield loss mechanisms
2013
CICC | Custom Integrated Circuits Conference
Christine P. Tan
Congshu Zhou
Yi Tian
Chang Liu
Hein Mun Lam
Jian Zhang
Mark Lu
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Novel customized manufacturable DFM solutions
2012
Mark Lu
Congshu Zhou
Yi Tian
Soo Muay Goh
ShyueFong Quek
Hein Mun Lam
Jian Zhang
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