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Hein Mun Lam
Hein Mun Lam
GlobalFoundries
Engineering
Manufacturing engineering
Physical design
Electronic engineering
Design for manufacturability
6
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3
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Machine learning versus Deep Learning in Low Yield Wafer Map Classification
2021
ASMC | Advanced Semiconductor Manufacturing Conference
Congshu Zhou
Hingpoh Kuan
Guozhong You
Douglas Chan
Jason Khaw
Summer Boo
Hein Mun Lam
Elton Ng
Juliana Puey
Saiking Chong
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AI Solution for Metrology Recipe Automation
2021
ASMC | Advanced Semiconductor Manufacturing Conference
Congshu Zhou
Zheng Zou
Fang Li
Seng Keat Lim
Jason Khaw
Summer Boo
Hein Mun Lam
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The value and effectiveness of sensor trace analytics in solving yield impact issues: A case study
2018
ASMC | Advanced Semiconductor Manufacturing Conference
Hein Mun Lam
Michael Zhao
Ski Sim
Kim Kok Gan
Tom Ho
Joe Lee
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Voltage regulator bin failure improved by optimized circuit layout and novel laser anneal process
2016
ASMC | Advanced Semiconductor Manufacturing Conference
Y. W. Ma
Wei Liang Huang
Chien Hsin Lai
P. G. Lim
Hein Mun Lam
Chee Kong Leong
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Design for manufacturing layout analyses correlate layout to physico-chemical yield loss mechanisms
2013
CICC | Custom Integrated Circuits Conference
Christine P. Tan
Congshu Zhou
Yi Tian
Chang Liu
Hein Mun Lam
Jian Zhang
Mark Lu
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Novel customized manufacturable DFM solutions
2012
Mark Lu
Congshu Zhou
Yi Tian
Soo Muay Goh
ShyueFong Quek
Hein Mun Lam
Jian Zhang
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