Old Web
English
Sign In
Acemap
>
authorDetail
>
Ja-Hum Ku
Ja-Hum Ku
Materials science
Optoelectronics
Gate oxide
Electronic engineering
Time-dependent gate oxide breakdown
4
Papers
7
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (4)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Channel Strain Characterization in Embedded SiGe by Nano-beam Diffraction
2008
Jinghong Li
Angela Lamberti
Anthony G. Domenicucci
L. Gignac
Henry K. Utomo
Zhijiong Luo
Nivo Rovedo
Sunfei Fang
Hung Ng
Judson R. Holt
Anita Madan
Chung Woh Lai
Ja-Hum Ku
Dominic J. Schepis
Jin-Ping Han
Mark Lagus
Show All
Source
Cite
Save
Citations (2)
Process integration of highly stable 1.25μm2 6T-SRAM cell with 45nm gate length triple gate transistors
2004
Kwon Lee
Jeong Hwan Yang
Shigenobu Maeda
You Seung Jin
Jung-A Choi
Su-Gon Bae
Yoon-hae Kim
Jeong-Hoon Ahn
Min-Chul Sun
Ja-Hum Ku
Hwa-Sung Rhee
Young-Sub You
Jin Young Kim
Byeong-Yun Name
Chang-Jin Kang
Ho-Kyu Kang
Kwang Pyuk Suh
Show All
Source
Cite
Save
Citations (0)
A method for producing a Kobaltsilizidfilms and for producing a cobalt silicide containing a semiconductor device
2003
Kyeong-Mo Koo
Ja-Hum Ku
Hye Jeong Park
Show All
Source
Cite
Save
Citations (0)
Poly-Si gate CMOSFETs with HfO2-Al2O3 laminate gate dielectric for low power applications
2002
Symposium on VLSI Technology
Jong-Ho Lee
Yun-Seok Kim
Hyung-Seok Jung
Jung Hyoung Lee
Nae-In Lee
Ho-Kyu Kang
Ja-Hum Ku
Hee Sung Kang
Y-T Kim
Kyung Hwan Cho
Show All
Source
Cite
Save
Citations (5)
1