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Felix Wust
Felix Wust
Fraunhofer Society
Electronic engineering
Engineering
Thermal
Thermal test
Degradation (geology)
2
Papers
9
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0
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Development and Validation of a Chip Integration Concept for Multi-Die GaAs Front Ends for Phased Arrays up to 60 GHz
2018
IEEE Transactions on Components, Packaging and Manufacturing Technology
Brian Curran
Jacob Reyes
Christian Tschoban
Jan Höfer
Arian Grams
Felix Wust
Matthias Hutter
Jens Leib
Marta Martinez-Vazquez
Rens Baggen
Ivan Ndip
Klaus-Dieter Lang
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Citations (6)
Approach for reliability of Thermal Interface Materials in battery cell sensors
2013
THERMINIC | International Workshop on Thermal Investigations of ICs and Systems
Torsten Nowak
Matthias Müller
H. Walter
O. Hölck
Felix Wust
Olaf Wittler
Klaus-Dieter Lang
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Citations (3)
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