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A. G. Touryanski
A. G. Touryanski
Reflectometry
Optics
X-ray
Ion
X-ray optics
6
Papers
24
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Investigation of quantum-dimensional structure parameters by X-ray optical, scanning tunneling and transmission electron microscopy
2013
arXiv: Materials Science
A. G. Touryanski
V. M. Senkov
S. S. Gizha
L. V. Arapkina
V. A. Chapnin
K. V. Chizh
V P Kalinushkin
M. S. Storozhevykh
O. V. Uvarov
V. A. Yuryev
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Investigation of ion-implanted layers by x-ray reflectometry method
2005
A. G. Touryanski
N. N. Gerasimenko
S. A. Aprelov
I. V. Pirshin
A. I. Poprygo
V. M. Senkov
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Investigation of ion - implanted layers by X-ray reflectometry method
2004
A. G. Touryanski
N. N. Gerasimenko
S. A. Aprelov
I. V. Pirshin
A. I. Poprygo
V. M. Senkov
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Investigation of ion - implanted layers by X-ray reflectometry method
2004
A. G. Touryanski
N. N. Gerasimenko
S. A. Aprelov
I. V. Pirshin
A. I. Poprygo
V. M. Senkov
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Two-wave X-ray optical diagnostics of GexSi1−x/Si modulation-doped heterostructures
2002
Physica E-low-dimensional Systems & Nanostructures
A. G. Touryanski
I. V. Pirshin
M. A. Rzaev
F. Schäffler
M Mühlberger
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Structure and optical properties of silicon implanted by high doses of 70 and 310 keV carbon ions
1980
Radiation Effects and Defects in Solids
I.P. Akimchenko
K. V. Kisseleva
V.V. Krasnopevtsev
A. G. Touryanski
V. S. Vavilov
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Citations (22)
1