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Tadashi Nakamura
Tadashi Nakamura
Mitsubishi Electric
Physics
Optoelectronics
MOSFET
Transistor
Electronic engineering
4
Papers
39
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Impact of Thermal Nitridation on Microscopic Stress-Induced Leakage Current in Sub-10-nm Silicon Dioxides
2000
Japanese Journal of Applied Physics
Tamotsu Ogata
Masao Inoue
Tadashi Nakamura
Naoki Tsuji
Kiyoteru Kobayashi
Kazuo Kawase
Hiroshi Kurokawa
Tatsunori Kaneoka
Setsuo Wake
Hideaki Arima
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Impact of nitridation engineering on microscopic SILC characteristics of sub-10-nm tunnel dielectrics
1998
IEDM | International Electron Devices Meeting
Tamotsu Ogata
Masao Inoue
Tadashi Nakamura
Naoki Tsuji
Kiyoteru Kobayashi
Kazumasa Kawase
Hiroshi Kurokawa
Tatsunori Kaneoka
Yoshikazu Ohno
H. Miyoshi
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Electron traps and excess current induced by hot-hole injection into thin SiO2 films
1996
Journal of The Electrochemical Society
Kiyoteru Kobayashi
Akinobu Teramoto
Yasuji Matsui
Makoto Hirayama
Akihiko Yasuoka
Tadashi Nakamura
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Citations (23)
High reliability of nanometer-range N/sub 2/O-nitrided oxides due to suppressing hole injection
1996
IEDM | International Electron Devices Meeting
Kiyoteru Kobayashi
Akinobu Teramoto
Tadashi Nakamura
Hiroshi Watanabe
Hiroshi Kurokawa
Yasuji Matsui
Makoto Hirayama
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Citations (6)
1