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Herve Deslandes
Herve Deslandes
Laser
Analytical chemistry
Engineering
Electronic engineering
Microscopy
5
Papers
9
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From EBT to LVP, from 130nm to 28nm node, Internal Timing Characterization Evolution
2012
Herve Deslandes
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Yield enhancement using a combination of wafer level Failure Analysis and defect isolation software: case studies
2008
Pierre Simon
Michel Thétiot
Bernard Picart
Cathy Kardach
Herve Deslandes
Fabien Dudkiewicz
Jean-Philippe Roux
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Limitations to photon-emission microscopy when applied to “hot” devices
2003
Microelectronics Reliability
Herve Deslandes
Ted R. Lundquist
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Liquid immersion lens technology applied to laser voltage probing of 130 nm process technology devices
2002
Journal of Vacuum Science & Technology B
Nagamani Nataraj
Herve Deslandes
William Lo
Travis M. Eiles
Patrick Pardy
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Developpement et caracterisation du systeme de detection infrarouge de l'experience civa-m, microscope imageur spectral de la mission rosetta
1999
Herve Deslandes
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